Gamble mode: Resonance contact mode in atomic force microscopy
نویسندگان
چکیده
منابع مشابه
Gamble mode: Resonance contact mode in atomic force microscopy
Active noise reduction has been accomplished in atomic force microscopy by applying a high frequency, low amplitude vibration to the cantilever while it is in contact with a surface. The applied excitation ~.200 kHz; ;1 nm! is acoustically coupled to the tip and dampens the resonance Q factors of the system. The applied frequency is well above the bandwidth of the acquisition system ~50 kHz!. W...
متن کاملNoise reduction in atomic force microscopy: Resonance contact mode
Noise reduction has been accomplished in atomic force microscopy by applying a high frequency, low amplitude vibration to the cantilever while it is in contact with a surface. The applied excitation ~.200 kHz; ;1 nm! is acoustically coupled to the tip and dampens the resonance Q factors of the system. The applied frequency is well above the bandwidth of the acquisition system ~50 kHz!. We call ...
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Atomic force microscopy operating in the contact mode is studied using total-energy pseudopotential calculations. It is shown that, in the case of a diamond tip and a diamond surface, it is possible for a tip terminated by a single atom to sustain forces in excess of 30 nN. It is also shown that imaging at atomic resolution may be limited by blunting of the tip during lateral scanning.
متن کاملVelocity dependent friction laws in contact mode atomic force microscopy.
Friction forces in the tip-sample contact govern the dynamics of contact mode atomic force microscopy. In ambient conditions typical contact radii between tip and sample are in the order of a few nanometers. In order to account for the large interaction area the dynamics of contact mode atomic force microscope (AFM) is investigated under the assumption of a multi-asperity contact interface betw...
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Understanding the mechanism of charge generation, distribution, and transfer between surfaces is very important for energy harvesting applications based on triboelectric effect. Here, we demonstrate dynamic nanotriboelectrification with torsional resonance (TR) mode atomic force microscopy (AFM). Experiments on rubbing the sample surface using TR mode for the generation of triboelectric charges...
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ژورنال
عنوان ژورنال: Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
سال: 1996
ISSN: 0734-211X
DOI: 10.1116/1.588729